The Cross-layer Reliability Visioning Study Group met July 8-9, 2009 in Los Alamos, NM.  This was the second of three scheduled meetings focused on how to address the growing challenges imposed by changes in device technology, system sizes, and application requirements.  A major goal of the Visioning process is to reach some consensus on how to achieve reliable computing using unpredictable components across different layers that dictate system reliability (i.e., device technology, design, architecture, software).  While the first meeting focused on defining the multi-dimensional cross-layer reliability design space, including both theoretical and practical aspects of the problem, the second meeting focused on considering cross-layer reliability from different application domains (e.g., consumer electronics, space/avionics, etc.).  The attendees were divided into visioning groups to target these individual domains.  Other visioning groups focused on developing common reliability metrics to address the cross-layer abstraction issue and addressing the technology reliability roadmap.  A number of common themes across the individual domains emerged, which will help to build consensus across the community as a research agenda is defined.

The third meeting will likely be scheduled for late October, though draft vision/consensus documents are being crafted before this next meeting.  The meeting will held at IBM in Austin, Texas, and will engage leaders from funding agencies as part of the program.